Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation Adam D. Kammers1 & Samantha Daly1,2,* 1 The University of Michigan Department of Mechanical Engineering, 2350 Hayward St., Ann

Source URL: dalylabs.engin.umich.edu

Details Interdisciplinary Center for Analytics on the Nanoscale (ICAN) Nanoscience is one of the five strategic, profile-building research areas of the University of Duisburg-Essen (UDE). For the organization of all nano

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• Scientific method
• Learning
• Electron microscopy
• Pathology
• Scientific instruments
• Microscopes
• Characterization
• Materials science
• Electron microscope
• University of Duisburg-Essen
• Nanotechnology
• Microscopy

Application Note 088 full High-Resolution Imaging in Different Atomic Force Microscopy Modes • An operation of AFM microscope in a temperature-stable cabinet facilitates high-resolution studies and makes molecular-sc

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• Scanning probe microscopy
• Chemistry
• Microbiology
• Optics
• Atomic-force microscopy
• Scanning tunneling microscope
• Microscopy
• Microscope
• Raman microscope
• Vibrational analysis with scanning probe microscopy
• Magnetic force microscope

4700 FESEM Operating Procedure 1. Fill funnel on the left side of the SEM with LN2~ 4 full funnels. On the column console of the SEM, place the “Obj.Apt.” switch in the “Degas” position for 30min, if you are the

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• Electron microscopy
• Learning
• Scanning electron microscope
• Analytical chemistry
• Scientific method
• Sample
• Vacuum
• Physics

Microsoft Word - Abstract-book_1st Bochum Workshop_20111011_1945.doc

Source URL: www.sfb642.rub.de

• Raman scattering
• Raman spectroscopy
• Spectroscopy
• Infrared spectroscopy
• Microscopy
• Raman microscope
• Fourier transform infrared spectroscopy
• Biomedical spectroscopy
• Vibrational analysis with scanning probe microscopy

Paper Formatting Instructions - Mo

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• Nuclear technology
• Nuclear chemistry
• Electron microscopy
• Nuclear physics
• Radiobiology
• Transmission electron microscopy
• Nuclear fuel
• Focused ion beam
• Nuclear fission product
• Burnup
• Fission products
• Electron microscope

Copyright © Microscopy Society of America 2012 Please cite as: Boone, Matthieu N.; De Witte, Yoni; Dierick, Manuel; Almeida, Ana and Van Hoorebeke, LucImproved signal-to-noise ratio in laboratory-based phase co

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Oufti: an integrated software package for high‐accuracy, high‐throughput quantitative microscopy analysis

Source URL: elflab.icm.uu.se

Single-photon sensitive light-in-flight imaging Genevieve Gariepy,1∗ Nikola Krstaji´c,2,3 Robert Henderson,2 Chunyong Li,1 Robert R. Thomson,1 Gerald S. Buller,1 Barmak Heshmat,4 Ramesh Raskar,4 Jonathan Leach1 and Da

Source URL: extremelight.eps.hw.ac.uk

• Laser science
• Spectroscopy
• Microscopy
• Photonics
• Light
• Light-in-flight imaging
• Ultrafast laser spectroscopy
• Ultrashort pulse
• Laser
• Fluorescence-lifetime imaging microscopy
• Streak camera
• Photon

CCEM Summer School on Electron Microscopy A 5-DAY COURSE for users with experience in electron microscopy, on the fundamentals of aberration corrected imaging, electron energy loss spectroscopy, electron tomography, ult

Source URL: ccem.mcmaster.ca