VOLUME 82, NUMBER 16 PHYSICAL REVIEW LETTERS 19 APRIL 1999

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Date: 2000-04-10 00:29:10 Field ion microscope Physical Review Science Microscopes Scanning probe microscopy Scanning tunneling microscope		VOLUME 82, NUMBER 16 PHYSICAL REVIEW LETTERS 19 APRIL 1999 Add to Reading List Source URL: www.csc.ust.hk Download Document from Source Website File Size: 105,31 KB Share Document on Facebook

	Application Note In-situ Scanning Electron Microscope (SEM) supplements Scanning Probe Microscopy (SPM) DocID: 1uSmr - View Document
	SPM Open Source Controller Model Mk2-A810 This DSP-based system has been specially designed to meet the Scanning Probe Microscopy (SPM) application requirements. The SPM Open Source Controller offers: 8 analog I/O capab DocID: 1t8Qa - View Document
	HIGH RESOLUTION SCANNING PROBE MICROSCOPY OF BIONANOSTRUCTURES Klinov D.V.1,2 1 Russian Institute of Physico-Chemical Medicine, 119992, Moscow, Malaya Pirogovskaya 1a, DocID: 1rC2g - View Document
	articles Discrete interactions in cell adhesion measured by single-molecule force spectroscopy Martin Benoit†, Daniela Gabriel‡, Günther Gerisch‡ and Hermann E. Gaub DocID: 1rnem - View Document
	Technology Opportunity, Ref. No. UAA novel algorithm for phase computation in atomic force microscopy A novel algorithm has been developed which provides highly accurate phase measurements. In particular, the al DocID: 1rmSQ - View Document