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![]() Date: 2009-11-11 03:30:09Ferroelectric materials Ceramic materials Electrical phenomena Condensed matter physics Lead compounds Lead zirconate titanate Ferroelectricity Piezoresponse force microscopy Curie temperature Matter Physics Electromagnetism | Add to Reading List |
![]() | data sheet IssuedattoAFM I low temperature atomic force microscope, interferometric sensorDocID: 1qYWt - View Document |
![]() | ) Xue Feng,†,#,* Byung Duk Yang,‡,# Yuanming Liu,§ Yong Wang,† Canan Dagdeviren,‡ Zhuangjian Liu,^ Andrew Carlson,‡ Jiangyu Li,§ Yonggang Huang, and John A. Rogers‡,z,* ARTICLEDocID: 1oTVo - View Document |
![]() | Application Note 083 Piezoresponse Force Microscopy in Its Applications • Ferrroelectric domains imaging • Hysteresis loops measurementsDocID: 1nsC7 - View Document |
![]() | Application Note 083 Piezoresponse Force Microscopy in Its Applications • Ferrroelectric domains imaging • Hysteresis loops measurementsDocID: 1n9ET - View Document |
![]() | Investigation of ferroelectric domains with scanning probe microscopeDocID: 1fs7J - View Document |