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Scanning probe microscopy / Intermolecular forces / Scientific method / Chemistry / Materials science / Atomic-force microscopy / Interferometry / Non-contact atomic force microscopy / Piezoresponse force microscopy


data sheet IssuedattoAFM I low temperature atomic force microscope, interferometric sensor
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Document Date: 2014-03-28 03:39:02

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File Size: 89,97 KB

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