<--- Back to Details
| First Page | Document Content | |
|---|---|---|
 Date: 2013-01-21 22:21:44Microscopes Chemistry Scanning tunneling microscope Intermolecular forces Atomic force microscopy Microscopy Canton of Neuchâtel Conductive atomic force microscopy NanoWorld Scanning probe microscopy Science Scientific method |
Add to Reading List |
Microsoft PowerPoint - ENGS-AFM [Compatibility Mode] | Mode Note Conductive AFM Probing the Local Electronic Structure of a Sample’s Surface Figure 1. Schematic diagram of the XE-series Conductive AFM systemDocID: 187wd - View Document |
| Mode Note Scanning Tunneling Microscopy (STM) Probing the Local Electronic Structure of a Sample’s Surface Scanning Tunneling Microscopy (STM) is one of the application modes for XE series SPM. STM is the ancestor ofDocID: 17Hwf - View Document |
| Microsoft PowerPoint - ENGS-AFM [Compatibility Mode]DocID: 130jA - View Document |
| Dimension FastScan The World’s Fastest AFM Innovation with IntegrityDocID: 12mTq - View Document |
| Pure environment NTEGRA Aura NTEGRA Aura Feel confident when everything isDocID: 11aQM - View Document |