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MOSFET
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#	Item
531	PDF Document Add to Reading List Source URL: www.nsti.org Language: English - Date: 2006-06-09 07:22:26 Short-channel effect UNIK Multigate device Field-effect transistor Drain Induced Barrier Lowering Threshold voltage MOSFET
532	PDF Document Add to Reading List Source URL: www.nsti.org Language: English - Date: 2006-06-09 07:20:00 Semiconductor devices Technology Threshold voltage Field-effect transistor Transistor Œ Ø Electronic engineering Electrical engineering Electromagnetism MOSFET
533	PDF Document Add to Reading List Source URL: www.nsti.org Language: English - Date: 2006-06-09 07:08:57 Design Quality Indicator MOSFET Dy Field-effect transistor Structure Architecture Construction Design
534	PDF Document Add to Reading List Source URL: www.nsti.org Language: English - Date: 2006-06-09 07:08:55 MOSFET Threshold voltage Field-effect transistor
535	PDF Document Add to Reading List Source URL: www.nsti.org Language: English - Date: 2006-06-09 07:18:36 Threshold voltage Short-channel effect Current–voltage characteristic Electromagnetism Electrical engineering Electronic engineering MOSFET
536	PDF Document Add to Reading List Source URL: www.nsti.org Language: English - Date: 2006-06-09 07:17:41 Integrated circuits Silicon Semiconductor devices MOSFET Transistors Multigate device Chenming Hu Silicon-germanium Field-effect transistor Electronic engineering Electrical engineering Electronics
537	PDF Document Add to Reading List Source URL: www.nsti.org Language: English - Date: 2006-06-09 07:09:07 Motorola MOSFET Application-specific integrated circuit Electronics Technology Freescale Semiconductor Power Architecture Electronic engineering
538	PDF Document Add to Reading List Source URL: www.nsti.org Language: English - Date: 2006-06-09 07:23:26 Noise Electronic engineering Johnson–Nyquist noise MOSFET Electromagnetism Electrical engineering Electronics
539	PDF Document Add to Reading List Source URL: www.epo.org Language: English - Date: 2011-06-14 11:51:48 Property law MOSFET Grant procedure before the European Patent Office Appeal procedure before the European Patent Office Amendments under the European Patent Convention European Patent Convention Field-effect transistor Inventive step and non-obviousness Representation before the European Patent Office European Patent Organisation Civil law Law
540	White Paper MOS Device Aging Analysis with HSPICE and CustomSim August 2011 Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:39:22 Semiconductors Hot carrier injection Semiconductor device fabrication MOSFET Reliability SPICE Electrical network Stress analysis Electronic engineering Electromagnetism Electronics

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