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Nanotechnology / Intermolecular forces / Atomic force microscopy / Nanoparticle / Electron / Magnetic force microscope / Local oxidation nanolithography / Scanning probe microscopy / Physics / Science


IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments
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Document Date: 2012-11-16 19:15:36


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Company

JEOL Company / Robotics Laboratory / Computer Sciences / /

Country

Japan / /

Currency

USD / /

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Facility

Institute of Industrial Science / Robotics Laboratory / University of Tokyo / University of California / /

IndustryTerm

continuum mechanics solution / digital signal processor / liquid surface energy mJ/m / contact imaging mode / mode imaging / adhesion energy / quantum devices / online recognition / manipulation tool / latex particle pushing applications / nano scale imaging / surface energy / intelligence system devices / possible solutions / noncontact imaging hardware / communication tools / physical and chemical phenomenon / imaging / absorption chemicals / nanotechnology products / /

Organization

African Union / University of Tokyo / Tokyo / Institute of Industrial Science / University of California / Berkeley / /

Person

Hideki Hashimoto / Semi-Autonomous Pushing / /

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Position

Controller / /

Product

P-762 / /

Technology

laser / 3-D / promising high technology / simulation / DSP / digital signal processor / /

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