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Scanning probe microscopy / Technology / Electrical components / Memristor / Titanium dioxide / Titanium / Local oxidation nanolithography / Atomic force microscopy / Resistive random-access memory / Chemistry / Emerging technologies / Matter


ISSN 10637826, Semiconductors, 2014, Vol. 48, No. 13, pp. 1757–1762. © Pleiades Publishing, Ltd., 2014. Original Russian Text © V.I. Avilov, O.A. Ageev, A.S. Kolomiitsev, B.G. Konoplev, V.A. Smirnov, O.G. Tsukanova,
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Document Date: 2015-01-21 05:36:16


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City

Moscow / /

Company

Pleiades Publishing Ltd. / ACS / BOC / O.A. Ageev A.S. / /

Country

United Kingdom / /

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Facility

O. G. Tsukanova Institute of Nanotechnologies / Southern Federal University / /

IndustryTerm

electronic device technology / microelectronics technology / metal / metal oxides / energy independence / nanosystem equipment / technologi cal equipment / efficiency multiprobe systems / /

Organization

O. G. Tsukanova Institute of Nanotechnologies / Electronics / and Electronic Equipment Engineering / Southern Federal University / /

Person

Rainer Waser / D. Jeong / B.G. Konoplev / V / Hisashi Shima / Ni Zhong / Masakazu Aono / U. Breuer / H. Schroeder / Hiro Akinaga / /

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ProvinceOrState

HRS / LRS / /

RadioStation

Nova / /

Technology

semiconductor / spectroscopy / lithography / random access / electronic device technology / microelectronics technology / Nano technology / /

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