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 Date: 2014-02-13 10:29:24Condensed matter physics Surface chemistry Scanning probe microscopy Kelvin probe force microscope Mobilities Materials science Chemistry Emerging technologies Physics Memristor |
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Microsoft PowerPoint - ACS_Nano-Strelcov_2013.pptx | Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Measuring dielectric properties at the nanoscale using Electrostatic Force MDocID: 1b1MA - View Document |
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| Nanosurf FlexAFM Your Versatile Research AFM for Materials & Life Science t Measurement capabilities in air and liquid t Versatility in applications and modes t Compatibility with inverted microscopesDocID: 18f5k - View Document |
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