An Ecomonical Alternative to Boundary Scan in Memory Devices

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Date: 2007-01-22 18:19:36 Manufacturing Boundary scan Design for testing Joint Test Action Group In-circuit test Automatic test pattern generation Integrated circuit design Input/output Reliability engineering Electronics manufacturing Electronic engineering Electronics		An Ecomonical Alternative to Boundary Scan in Memory Devices Add to Reading List Source URL: grouper.ieee.org Download Document from Source Website File Size: 373,80 KB Share Document on Facebook

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