ISO 25178

Results: 8



#Item
1Metrology / ISO 25178 / Surface metrology

SURFACE MORPHOLOGY INVESTIGATIONS of PRE- AND POST- CONSERVATION PROCESS: TECHNIQUES & ANALYSIS Images: Toile Airbag; Fibers; Filter Paper; Musical Instrument Thomas G. Mathia is a Senior Scientist at the Laboratoire de

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Source URL: www.si.edu

Language: English - Date: 2010-10-08 11:28:58
2Science / Metalworking terminology / Tribology / SI base units / Uncertainty / Measurement uncertainty / ISO 25178 / Surface metrology / Surface roughness / Measurement / Metrology / Knowledge

Microsoft Word - APPENDIX-A for web 18mar14.doc

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Source URL: www.nist.gov

Language: English - Date: 2014-03-19 17:08:51
3Metrology / ISO 25178 / Surface metrology

SURFACE MORPHOLOGY INVESTIGATIONS of PRE- AND POST- CONSERVATION PROCESS: TECHNIQUES & ANALYSIS Images: Toile Airbag; Fibers; Filter Paper; Musical Instrument Thomas G. Mathia is a Senior Scientist at the Laboratoire de

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Source URL: www.si.edu

Language: English - Date: 2010-10-08 11:28:58
4ISO 25178 / Film speed

openGPS Declaration of Intent

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Source URL: open-gps.sourceforge.net

Language: English - Date: 2013-03-08 09:51:05
5Technical communication / XML / ISO 25178 / Computing / Computer file formats / Markup languages

20080128_openGPS_Chemnitz_all

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Source URL: open-gps.sourceforge.net

Language: English - Date: 2013-03-08 09:51:05
6Microscopy / Science / Chemistry / Metrology / Technology / ISO 25178 / Materials science / Waviness / Profilometer

3D Measurements in the Scanning E l e c t ron Micro s c o p e MeX turns your SEM into a fully functional 3D measurement device. It visualizes the topography of the observed object and 3D analysis directly in the digital

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Source URL: old.cpx-solutions.com

Language: English - Date: 2011-06-13 19:16:14
7ISO 25178 / Film speed

® ~ Declaration of Intent

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Source URL: open-gps.sourceforge.net

Language: English - Date: 2013-03-08 09:51:05
8Measurement / MountainsMap / Digital Surf / ISO 25178 / Surface metrology / Profilometer / Mechanical engineering / Nanometrology / Atomic force microscopy / Science / Scientific method / Metrology

KVOF!3119!¦!IPST.T„SJF Nano-surface

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Source URL: www.micronora.com

Language: English - Date: 2012-10-17 09:11:24
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