PRISM Seminar Series – Spring 2009 Modeling of Dielectric Charging in RF MEMS Prof. Ashraf Alam Purdue University School of Electrical and Computer Engineering - Gate dielectric - Document - PDFSEARCH.IO

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RF MEMS Semiconductor devices Microelectromechanical systems Capacitor Gate oxide IEEE Kiyo Tomiyasu Award Materials science Technology Electromagnetism		PRISM Seminar Series – Spring 2009 Modeling of Dielectric Charging in RF MEMS Prof. Ashraf Alam Purdue University School of Electrical and Computer Engineering Add to Reading List Source URL: www.purdue.edu Download Document from Source Website File Size: 225,14 KB Share Document on Facebook