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Integrated circuits / Semiconductor devices / CMOS / Electronic design / Leakage / X-ray scattering techniques / Transistor / Silicon on sapphire / MOSFET / Electrical engineering / Electronic engineering / Electromagnetism


Contribution to Development of Next-Generation CMOS Products Research method X-ray diffraction/scattering
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Document Date: 2014-01-30 02:15:24

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