Computer Graphics Volume18, Number 3 July 1984

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Date: 2015-05-15 19:30:30 Science of photography Distributed ray tracing Rendering Ray tracing Ray casting Reflection Depth of field Motion blur Ray Optics 3D computer graphics Geometrical optics		Computer Graphics Volume18, Number 3 July 1984 Add to Reading List Source URL: graphics.pixar.com Download Document from Source Website File Size: 888,22 KB Share Document on Facebook

	KNMF Laboratory for Microscopy and Spectroscopy Helium Ion Microscope (HIM) The Zeiss Orion NanoFab allows high-resolution imaging with high surface sensitivity and a depth-of-field 5-10 times higher than in a modern FE DocID: 1v5d9 - View Document
	Performance of extended depth of field systems and theoretical diffraction limit Frédéric Guichard, Frédéric Cao, Imène Tarchouna, Nicolas Bachelard DxO Labs, 3 Rue Nationale, 92100 Boulogne, France ABSTRACT Extende DocID: 1uL14 - View Document
	Extended depth-of-field using sharpness transport across color channels Frédéric Guichard1, Hoang Phi Nguyen, Régis Tessières, Marine Pyanet, Imène Tarchouna, Frédéric Cao DxO Labs, 3 Rue Nationale, 92100 Boulogne DocID: 1ulr1 - View Document
	Non-Linear Aperture for Stylized Depth of Field Adrien Bousseau - INRIA / Grenoble University (a) Pinhole (b) Average DocID: 1tFBM - View Document
	NonLinear Aperture for Stylized Depth of Field Adrien Bousseau INRIA / Grenoble University Lightfield data from http://lightfield.stanford.edu/ Pinhole aperture DocID: 1tDpF - View Document