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![]() Date: 2013-04-20 18:07:00Technology Chemical-mechanical planarization Copper interconnect Microelectromechanical systems Etching Surface finishing Surface micromachining Shallow trench isolation Photolithography Semiconductor device fabrication Materials science Microtechnology | Add to Reading List |
![]() | Photon Factory Activity Report 2010 #28 Part BSurface and Interface 16A/2008U-004 Nano-scale characterization of poly-Si gate on high-k gate stack structures byDocID: 18yyj - View Document |
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![]() | SIMTech Technical Report (PT[removed]JT) Chemical Mechanical PlanarizationDocID: 3ULZ - View Document |