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Backscatter
Results: 510

#	Item
261	Evaluating Acoustic Technologies to Monitor Aquatic Organisms at Renewable Energy Sites John K. Horne and Sandra Parker-Stetter University of Washington, School of Aquatic and Fishery Sciences Box[removed]Seattle, WA 9819 Add to Reading List Source URL: www.nopp.org Language: English - Date: 2014-12-24 10:42:46 Statistics Echo sounding Surveying Tidal power Sonar Multibeam echosounder Backscatter Northwest National Marine Renewable Energy Center Turbine Oceanography Tides Earth
262 $Spectroscopy / Fraunhofer Society / Laboratories / Diffraction / Reliability engineering / Ambient intelligence / Tribology / Electron backscatter diffraction / Science / Materials science / Chemistry$	F R A U N H O F E R I N S T I T U T E F O R M E C H A N I C S O F M AT E R I A L S I W M MATERIAL RESEARCH IN DENTISTRY AND PERSONAL CARE Our Competencies Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2013-04-23 02:51:46 Spectroscopy Fraunhofer Society Laboratories Diffraction Reliability engineering Ambient intelligence Tribology Electron backscatter diffraction Science Materials science Chemistry
263	Conservatives call for outright ban on the use of harmful body scanners Brussels, 2nd September[removed]Much controversy has surrounded the EU’s decision to introduce body scanners into EU airports. Philip Bradbourn, Co Add to Reading List Source URL: torymeps.com Language: English - Date: 2010-11-18 08:22:15 Measuring instruments Electromagnetic radiation Privacy Aviation security Backscatter X-ray Explosives detection Full body scanner Philip Bradbourn X-ray Security Radiography Medicine
264 $Semiconductor device fabrication / Thin film deposition / Electron beam / Focused ion beam / Failure analysis / Electron beam induced current / Electron microscope / Scanning electron microscope / Electron backscatter diffraction / Scientific method / Science / Electron microscopy$	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:29:23 Semiconductor device fabrication Thin film deposition Electron beam Focused ion beam Failure analysis Electron beam induced current Electron microscope Scanning electron microscope Electron backscatter diffraction Scientific method Science Electron microscopy
265	Hybrid Analog-Digital Backscatter Platform for High Data Rate, Battery-Free Sensing 1 Vamsi Talla1 , Michael Buettner2 , David Wetherall2 and Joshua R. Smith1,2 Electrical Engineering Department and 2 Computer Science an Add to Reading List Source URL: sensor.cs.washington.edu Language: English - Date: 2013-01-23 19:24:46 Wireless sensor network Technology Electronics Radio-frequency identification Wireless Wireless identification and sensing platform Sensor node Microphone Universal Software Radio Peripheral Humanâ€“computer interaction Automatic identification and data capture Ubiquitous computing
266	Turbocharging Ambient Backscatter Communication Aaron N. Parks†, Angli Liu†, Shyamnath Gollakota, Joshua R. Smith University of Washington {anparks, anglil, gshyam, jrsjrs}@uw.edu † Add to Reading List Source URL: homes.cs.washington.edu Language: English - Date: 2014-06-19 12:31:39 Radio resource management Radio electronics Data transmission Information theory Radio-frequency identification Wireless Radio Antenna Television antenna Telecommunications engineering Electronic engineering Technology
267	Ambient Backscatter: Wireless Communication Out of Thin Air Vincent Liu, Aaron Parks, Vamsi Talla, Shyamnath Gollakota, David Wetherall, Joshua R. Smith University of Washington {liuv, anparks, vamsit, gshyam, djw, jrsjr Add to Reading List Source URL: abc.cs.washington.edu Language: English - Date: 2013-08-12 20:53:09 Radio electronics Radar Backscatter Radio-frequency identification Radio Antenna Bit error rate Transmitter Orthogonal frequency-division multiplexing Telecommunications engineering Electronic engineering Technology
268 $Diffraction / Electron backscatter diffraction / Spectroscopy / Scanning electron microscope / Electron microscope / Bruker / Scientific method / Science / Electron microscopy$	Microsoft PowerPoint - Serial Number Reconstruction Poster.ppt [Compatibility Mode] Add to Reading List Source URL: www.nist.gov Language: English - Date: 2014-12-12 16:44:04 Diffraction Electron backscatter diffraction Spectroscopy Scanning electron microscope Electron microscope Bruker Scientific method Science Electron microscopy
269 $Failure / Materials science / Electron microscopy / Maintenance / Semiconductor device fabrication / Failure analysis / Electron microscope / Electron backscatter diffraction / Microelectromechanical systems / Science / Scientific method / Physics$	CONTACT Prof. Dr. Matthias Petzold Fraunhofer CAM Heideallee 19 (office) \| Walter-Hülse-Str. 1 (mail[removed]Halle (Saale) \| Germany Phone: +[removed] Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:30:28 Failure Materials science Electron microscopy Maintenance Semiconductor device fabrication Failure analysis Electron microscope Electron backscatter diffraction Microelectromechanical systems Science Scientific method Physics
270	Enabling Instantaneous Feedback with Full-duplex Backscatter Vincent Liu†, Vamsi Talla†, Shyamnath Gollakota University of Washington {liuv, vamsit, gshyam}@uw.edu † Add to Reading List Source URL: homes.cs.washington.edu Language: English - Date: 2014-07-14 09:54:33 Electronic engineering Error detection and correction Network performance Information theory Bit error rate Ratios Channel Duplex Software-defined radio Telecommunications engineering Data transmission Information

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