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|---|---|---|
 Date: 2009-12-27 18:00:00Scientific method Nanotechnology Microscopy Cantilever Friction Atomic force microscopy Piezoresponse force microscopy Scanning probe microscopy Science Physics |
| data sheet IssuedattoAFM I low temperature atomic force microscope, interferometric sensorDocID: 1qYWt - View Document |
| ) Xue Feng,†,#,* Byung Duk Yang,‡,# Yuanming Liu,§ Yong Wang,† Canan Dagdeviren,‡ Zhuangjian Liu,^ Andrew Carlson,‡ Jiangyu Li,§ Yonggang Huang, and John A. Rogers‡,z,* ARTICLEDocID: 1oTVo - View Document |
| Application Note 083 Piezoresponse Force Microscopy in Its Applications • Ferrroelectric domains imaging • Hysteresis loops measurementsDocID: 1nsC7 - View Document |
| Application Note 083 Piezoresponse Force Microscopy in Its Applications • Ferrroelectric domains imaging • Hysteresis loops measurementsDocID: 1n9ET - View Document |
| Investigation of ferroelectric domains with scanning probe microscopeDocID: 1fs7J - View Document |