<--- Back to Details
First PageDocument Content
Electrical breakdown / Diodes / Semiconductors / Electrodes / Zener diode / Zener effect / P–n junction / Avalanche breakdown / Cathode / Electromagnetism / Electricity / Electrical engineering
Date: 2009-03-30 06:16:08
Electrical breakdown
Diodes
Semiconductors
Electrodes
Zener diode
Zener effect
P–n junction
Avalanche breakdown
Cathode
Electromagnetism
Electricity
Electrical engineering

TVS/Zener Theory and Design Considerations Handbook

Add to Reading List

Source URL: www.onsemi.com

Download Document from Source Website

File Size: 1,10 MB

Share Document on Facebook

Similar Documents

PDF Document

DocID: 1vwMm - View Document

Simulation Tool for IGBT modules R. Schnell ABB Switzerland Ltd, Semiconductors, Fabrikstrasse 3, CH – 5600 Lenzburg, Switzerland e-mail: Abstract: ABB has recently released a new simulation

DocID: 1vk86 - View Document

Reducing Gate-Driven Leakage in 2D Semiconductors: Two-dimensional materials such as graphene and MoS2 have a wide range of bandgaps and effective masses, making them suitable for many different applications including m

DocID: 1vg3M - View Document

The Toyota Riken International Workshop Organic Semiconductors, Conductors, and Electronics  October 24, Wednesday Octeber 25, Thursday 9:00 Hisao Ishii

DocID: 1vehL - View Document

ABB Semiconductors AG Soft Punch Through (SPT) Soft Punch Through (SPT) – Setting new Standards in 1200V IGBT S. Dewar, S. Linder, C. von Arx, A. Mukhitinov, G. Debled

DocID: 1vaF8 - View Document