Toggle navigation
PDFSEARCH.IO
Document Search Engine - browse more than 18 million documents
Sign up
Sign in
Back to Results
First Page
Meta Content
View Document Preview and Link
SISPAD 2012, September 5-7, 2012, Denver, CO, USA A Unified Computational Scheme for 3D Statistical Simulation of Reliability Degradation of Nanoscale MOSFETs F. Adamu-Lema, S. Amoroso, S. Markov, L. Gerrer
Add to Reading List
Document Date: 2013-02-12 08:39:05
Open Document
File Size: 2,55 MB
Share Result on Facebook
UPDATE
SISPAD 2012, September 5-7, 2012, Denver, CO, USA A Unified Computational Scheme for 3D Statistical Simulation of Reliability Degradation of Nanoscale MOSFETs F. Adamu-Lema, S. Amoroso, S. Markov, L. Gerrer