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Spectroscopy / Condensed matter physics / Environmental chemistry / Materials science / X-ray absorption spectroscopy / Photoemission spectroscopy / Absorption spectroscopy / XANES / Chemistry / Scientific method / Science


Photon Factory Activity Report 2004 #22 Part BSurface and Interface 2C/2002S2-002 Precise determination of band offsets and chemical states in SiN/Si
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Document Date: 2010-01-05 10:31:06


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City

Tokyo / /

Company

Matsushita / /

Country

Japan / /

Currency

pence / /

/

Facility

The University of Tokyo / Photon Factory / /

IndustryTerm

nitride technology / technology node / energy resolution / chemical vapor deposition methods / hot-carrier resistance / chemical states / device technology / energy / /

MusicGroup

Surface / Interface / SiN / Valence / /

Organization

High-Energy Accelerator Research Organization / University of Tokyo / /

Technology

spectroscopy / x-ray / device technology / nitride technology / chemical vapor deposition / /

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