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Computer memory / Single event upset / Field-programmable gate array / Soft error / Altera / Error detection and correction / Semiconductor intellectual property core / Cyclic redundancy check / LEON / Electronic engineering / Digital electronics / Electronics
Date: 2014-06-19 13:37:54
Computer memory
Single event upset
Field-programmable gate array
Soft error
Altera
Error detection and correction
Semiconductor intellectual property core
Cyclic redundancy check
LEON
Electronic engineering
Digital electronics
Electronics

Mitigating Single Event Upsets

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