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Reliability engineering / Engineering / Engineering statistics / Reliability / United States Military Standard / Failure rate / Physics of failure / Mean time between failures / Institute of Electrical and Electronics Engineers / Survival analysis / Failure / Systems engineering


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Document Date: 2011-06-08 19:41:33


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File Size: 41,25 KB

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City

Dallas / Indianapolis / /

Company

Raytheon / 3M / Crane / Non / NSWC Crane / Boeing / Northrop Grumman / Revision Working Group / /

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Event

FDA Phase / /

Facility

Aerospace Vehicle Systems Institute / /

IndustryTerm

sponsored aerospace industry collaborative research / open technology / on-line community / electronic systems / dynamic/web-based tool / actual hardware / electronics industry / electronic equipment / online database / electronic document submission tool / component technologies / last working / /

Organization

Aerospace Vehicle Systems Institute / IEEE Reliability Society / Revision Project Defense Standardization Program Office / Johnson AFRL/RXSA Douglas Loescher Sandia National Lab / VMEbus International Trade Association / Navy / VITA Standards Organization / Naval Surface Warfare Center / Department of Defense / /

Person

Dave Nichols / Joe Rodenbeck / Greg Saunders / David H Johnson / Douglas Loescher Sandia / Jim Garten / Dan Quearry / Dave Nicholls / Tyrone Jackson / David Nicholls / Gerry Thomas / Larry Mosher / Bill Allen / Jim McLeish / Dave Johnson / Allen Dan Jacob Bob / Dan Jacob Bob Ricco / Bill Allen Dan Jacob / Jack Thompson / Jeff Harms / Doug Loescher / Lou Gullo / Louis Gullo Raytheon Jeffrey Harms / /

Position

Chairman / /

Product

HDBK-217 / /

ProvinceOrState

Indiana / /

Technology

semiconductor / data warehouse / Lasers / component technologies / /

URL

www.crane.navy.mil / /

SocialTag