NIST gets new angle on X-ray measurements

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$Statistical theory / Metrology / Diffraction / Spectroscopy / X-ray spectroscopy / X-ray / Uncertainty / Metre / Angle / Statistics / Science / Measurement$ Date: 2015-03-19 07:06:12 Statistical theory Metrology Diffraction Spectroscopy X-ray spectroscopy X-ray Uncertainty Metre Angle Statistics Science Measurement		NIST gets new angle on X-ray measurements Add to Reading List Source URL: phys.org Download Document from Source Website File Size: 65,18 KB Share Document on Facebook

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