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Spectroscopy / Surface chemistry / Molecular physics / Condensed matter physics / Ultraviolet radiation / X-ray photoelectron spectroscopy / Ultraviolet photoelectron spectroscopy / Zinc oxide / Photoemission spectroscopy / Chemistry / Science / Scientific method


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Document Date: 2015-05-31 04:48:59


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City

Weinheim / /

Company

FEI Company / Plastic Electronics / Ga2O3 ZnO In2O3 Ag / Gatan Inc. / VCH Verlag GmbH & Co. KGaA / Agilent / Blackett Laboratory / /

Country

Germany / /

Currency

pence / /

/

Facility

Greece Institute of Chemical Engineering / Cornell University / King Abdullah University of Science / Technological Educational Institute / Aristotle University of Thessaloniki / University of Crete / Imperial College / The Netherlands Institute / Dutch Polymer Institute / /

IndustryTerm

metal-oxide layers / solution-processed semiconducting metal oxide / metal-oxide films / energy / /

Movie

Characterization Methods S1 / /

OperatingSystem

XP / Fermi / /

Organization

Technological Educational Institute / Photonics & Electrical Engineering Department / Materials Science & Technology Department / University of Crete / Centre for Plastic Electronics / African Union / Imperial College London / Aristotle University of Thessaloniki / Foundation of Research and Technology Hellas / Cornell / King Abdullah University of Science and Technology / Physics Department / Center of Materials Technology and Photonics / Foundation for Research and TechnologyHellas / Department of Materials / Dutch Polymer Institute / Department of Physics / Division of Physical Sciences and Engineering / Cornell University / Greece Institute of Chemical Engineering and High Temperature Processes / /

Person

Kelvin Probe / John G. Labram / Hendrik Faber / Thomas D. Anthopoulos / Emmanuel Kymakis / Emmanuel Stratakis / Hung Lin / Martyn McLachlan / Neil D. Treat / Ruipeng Li / Kui Zhao / Aram Amassian / /

Technology

semiconductor / radiation / Laser / X-ray / Materials Technology / spectroscopy / /

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