APPLIED PHYSICS LETTERS VOLUME 76, NUMBER[removed]JUNE 2000

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Date: 2000-07-05 21:47:59 Noise Electronic engineering Shot noise Johnson–Nyquist noise Biasing Superconducting tunnel junction Electromagnetism Electrical engineering Physics		APPLIED PHYSICS LETTERS VOLUME 76, NUMBER[removed]JUNE 2000 Add to Reading List Source URL: www.yale.edu Download Document from Source Website File Size: 50,65 KB Share Document on Facebook

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