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![]() Date: 2012-04-18 17:00:24Microcontrollers Electronics manufacturing Embedded systems Instruction set architectures Digital electronics Atmel AVR In-system programming In-circuit test Joint Test Action Group Electronics Electronic engineering Computer architecture | Add to Reading List |
![]() | 1 ELLEN MACARTHUR FOUNDATION • CIRCULAR CONSUMER ELECTRONICS: AN INITIAL EXPLORATION CIRCULAR CONSUMERDocID: 1xVXt - View Document |
![]() | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 64, NO. 12, DECEMBERAdaSharing: Adaptive Data Sharing in Collaborative RobotsDocID: 1xVjO - View Document |
![]() | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 64, NO. 8, AUGUSTReliability and Temporality Optimization for Multiple Coexisting WirelessHART NetworksDocID: 1xUDa - View Document |
![]() | Reverse Logistics for Consumer Electronics: Forecasting Failures, Managing Inventory, and Matching Warranties by Andre du Pin Calmon Submitted to the Sloan School of ManagementDocID: 1xTwd - View Document |
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