Implementing and Using a Mixed-Signal Test Bus Stephen Sunter [removed]

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Date: 2004-11-27 10:19:57 Manufacturing Electronic design Integrated circuits Embedded systems Joint Test Action Group Boundary scan Digital electronics IC power supply pin Integrated circuit design Electronic engineering Electronics Electronics manufacturing		Implementing and Using a Mixed-Signal Test Bus Stephen Sunter [removed] Add to Reading List Source URL: grouper.ieee.org Download Document from Source Website File Size: 1,40 MB Share Document on Facebook

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