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Spurious
Results: 211

#	Item
141	TC[removed]Minutes page 1 of[removed]:23 PM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-05-16 17:24:55 Electrical engineering Analog-to-digital converter Effective number of bits Quantization error Spurious-free dynamic range Delta-sigma modulation Digital-to-analog converter SINAD Sampling Digital signal processing Electronics Electromagnetism
142	IEEE-STD-1658 DAC STANDARDS WORKING COMMITTEE Webex Conference Call 23 March 2011, 8:00 AM to 1:00 PM PST Attendees: Steve Tilden Sol Max Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2011-03-28 15:36:46 Electromagnetism Spurious-free dynamic range Oscilloscope Clock feedthrough Reconstruction filter Feedthrough Digital signal processing Technology Signal processing
143	TRS 1310 Published FEBRUARY 2014 Add to Reading List Source URL: www.dot.state.mn.us Language: English - Date: 2014-02-18 11:58:31 Pavements Pavement engineering Transport engineering Road surface Spurious-free dynamic range Subgrade Road Falling weight deflectometer Transport Land transport Road transport
144	Minutes of 1241 Standards Committee Meeting in Colorado Springs, Colorado USA – June 14, 2006 Minutes Prepared by: Solomon Max – 2006-June 14 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Conve Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-21 15:59:45 Telecommunications engineering Bit error rate Network performance Ratios IEEE 802.11n-2009 Analog-to-digital converter Undersampling Spurious-free dynamic range Conscription in the United States Digital signal processing Measurement Data transmission
145	Minutes of 1241 Standards Committee Meeting in Tucson, Arizona USA – February 19, 2009 Minutes Prepared by: Solomon Max – 2005-March-12 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2009-03-18 16:42:16 Electronics Electromagnetism Analog-to-digital converter Spurious-free dynamic range Flash ADC Sampling Digital signal processing Electronic circuits Electronic engineering
146	IEEE-STD-1658 DAC STANDARDS WORKING COMMITTEE TUCSON, AZ 18 FEBRUARY 2009, 09:00 – 17:00 Attendees: Steve Tilden, Retired, Chair and Host Sol Max, LTX-Credence Corporation, Secretary Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2009-03-18 06:31:06 Digital signal processing Spurious-free dynamic range
147	P1658 Digital to Analog Standard Meeting, February 21, 2008 Attendees: Steve Tilden, Texas Instruments (Chair) [removed] Robert Graham, Sandia National Labs., Albuquerque, NM USA [removed] Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-03-03 15:23:27 Electronic engineering Digital-to-analog converter Analog-to-digital converter Sampling Spurious-free dynamic range Differential nonlinearity Quantization error Effective number of bits Signal-to-noise ratio Digital signal processing Electronics Electromagnetism
148	Minutes of March 17, 2004 TC-10 Meeting in Boulder, Colorado Draft Standard for Terminology and Test Methods for Digital to Analog Converters Attendance: Steve Tilden Tom Linnenbrink Bill Boyer Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2004-04-27 12:19:28 Technology Digital-to-analog converter Spurious-free dynamic range Signal generator Differential nonlinearity Effective number of bits Integral nonlinearity Digital signal processing Electronics Electromagnetism
149	IEEE-STD-1658 DAC STANDARDS WORKING COMMITTEE LTX-Credence Milpitas, CA USA 27 October 2010, 9:00 – 17:00 Attendees: Steve Tilden Sol Max Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2010-11-08 09:41:01 Electronic engineering Spurious-free dynamic range Digital-to-analog converter Reconstruction filter Zero-order hold Modulation Noise Digital signal processing Electronics Electromagnetism
150	1241 Analog to Digital Standard Meeting, September 24, 2008 Modified – November 7, 2008 Location: Florence, (Italy) Attendees: Tom Linnenbrink, Hittite, (Chair, TC-10) [removed] Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-11-07 15:25:47 SINAD SHA Solomon Tilden Technology Hebrew Bible Old Testament Digital signal processing Analog-to-digital converter Spurious-free dynamic range

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