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Parametric Curve Tracer Configurations High Power Device Characterization Characterizing and testing today’s high power semiconductor devices and components is placing a high
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Document Date: 2014-04-14 10:29:30

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File Size: 499,22 KB

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Company

ACS Basic Edition Software / Confidence SEMICONDUCTOR / Vf / Semiconductor Parametric Test Software / BASIC Component Test Software / /

Country

United States / /

IndustryTerm

power device / device characterization / power characterization systems / characterization tools / management software / real-time control / rise time pulses to minimize device / power devices / test equipment / real-time trace mode / /

Organization

Device Test Board / 8010-CTB Customizable Test Board / 8010-DTB Device Test Board / /

/

Position

characterization engineer / Drain/Collector / Collector / /

ProgrammingLanguage

V / DC / D / /

Technology

semiconductor devices / /

URL

www.keithley.com / /

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