Back to Results
First PageMeta Content
Scanning probe microscopy / Microscopes / Emerging technologies / Microscopy / Scanning tunneling microscope / Nanotechnology / Silicene


N1.13 Scanning Tunneling Microscopy of Silicon Surfaces Albert Liu With the decreasing scale of microelectronics and nanotechnology, knowledge of the properties of metal and semiconductor surfaces at the atomic scale is
Add to Reading List

Document Date: 2014-10-02 04:23:39


Open Document

File Size: 12,39 KB

Share Result on Facebook