National Nanotechnology Infrastructure Network Vol

First Page		Document Content
Date: 2012-10-30 10:11:55 Materials science Focused ion beam Nanotechnology Nanometrology Nanolithography Microelectromechanical systems Electron beam lithography Scanning electron microscope Electron microscope Scientific method Electron microscopy Science		National Nanotechnology Infrastructure Network Vol Add to Reading List Source URL: nnin.org Download Document from Source Website File Size: 34,26 KB Share Document on Facebook

	IEEE TRANSACTIONS ON MAGNETICS, VOL. 37, NO. 4, JULYMagnetic Properties of Fe Microstructures with Focused Ion Beam-Fabricated Nano-Constrictions DocID: 1vfvg - View Document
	Physical Geography, 2013 Vol. 34, No. 3, 159–173, http://dx.doi.orgVarnish microlaminations: new insights from focused ion beam preparation David Krinsleya, Jeffrey Dittob, Kurt Langworthy DocID: 1sq0k - View Document
	Nano Wired V O L U M E NREC MISSION  DocID: 1qzYt - View Document
	SCANNING VOL. 33, 78–) & Wiley Periodicals, Inc. Investigation of Tibetian Plateau Varnish: New Findings at the Nanoscale Using Focused Ion Beam and Transmission Electron Microscopy Techniques DocID: 1pOa6 - View Document
	Precambrian Research–54 Focussed ion beam preparation and in situ nanoscopic study of Precambrian acritarchs Andr´e Kempe a,1 , Richard Wirth b , Wladyslaw Altermann c,∗ , Robert W. Stark a , J. Willi DocID: 1p8Ij - View Document