<--- Back to Details
First PageDocument Content
Science / Geometrical optics / Microscopes / Electron beam / Transmission electron microscopy / Scanning transmission electron microscopy / Electron microscope / Optical aberration / Condenser / Optics / Electron microscopy / Scientific method
Date: 2008-11-03 09:22:04
Science
Geometrical optics
Microscopes
Electron beam
Transmission electron microscopy
Scanning transmission electron microscopy
Electron microscope
Optical aberration
Condenser
Optics
Electron microscopy
Scientific method

6 Scanning Transmission Electron Microscopy for Nanostructure

Add to Reading List

Source URL: stem.ornl.gov

Download Document from Source Website

File Size: 1,61 MB

Share Document on Facebook

Similar Documents

MOPSO02 Proceedings of FEL2013, New York, NY, USA MEASUREMENT OF ELECTRON-BEAM AND SEED LASER PROPERTIES USING AN ENERGY CHIRPED ELECTRON BEAM*

DocID: 1vq8o - View Document

The 31st ICFA Advanced Beam Dynamics Workshop on Electron-Cloud Effects "ECLOUD04" Napa (California), April 19-23, 2004 Sponsored by LBNL, CERN, ORNL, SNS and ICFA Main website: http://www.cern.ch/icfa-ecloud04 Fourth An

DocID: 1vlON - View Document

NanoTube N1 60 kV Uncompromising Nano Performance The Nanotube N1 60 kV is based on advanced electron optics refined from the workhorse MetalJet e-beam platform and the latest tungsten-diamond

DocID: 1vkuP - View Document

MOICNO01 Proceedings of FEL2013, New York, NY, USA GENERATION OF A TRAIN OF SHORT PULSES BY MEANS OF FEL EMISSION OF A COMBED ELECTRON BEAM

DocID: 1vk2t - View Document

Space-Charge Compensation of Proton Beams with Trapped Electron Columns from Beam-Induced Rest-Gas Ionization Giulio Stancari Accelerator Physics Center Fermi National Accelerator Laboratory

DocID: 1vhu5 - View Document