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Integrated circuits / Parasitic extraction / Electronic design / Digital electronics / Signal integrity / Signoff / Application-specific integrated circuit / Integrated circuit design / SPICE / Electronic engineering / Electronic design automation / Electronics


White Paper Extraction Techniques for High-performance, High-capacity Simulation September 2009
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Document Date: 2014-11-07 14:32:47


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File Size: 663,13 KB

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Company

SynopsysInc. / PLX technology / NS/Texas Instruments Inc. / /

Country

United States / /

IndustryTerm

metal sheet resistance / process technologies / system-on-chip / simulation tools / hierarchical extraction technology / extraction solution / selective device / isomorphic hierarchical back-annotation technology / parasitic extraction tool / in-context device / flat extraction technology accounts / process technology / memory design applications / reduction algorithms / metal-to-diffusion contact resistance / feature to selectively choose device / parasitic extraction solution / simulation solution / process technology demands / technology scaling / parasitic extraction tools / flat extraction technology / sub-wavelength manufacturing processes / verification tools / technology progression / extraction tools / simulation solutions / metal layers / maximum annotation / /

Person

Omar Shah / /

Position

designer / Executive / /

Product

CustomSim / StarRC parasitic extraction tool / StarRC parasitic extraction solution / StarRC / Synopsys CustomSim / /

Technology

reduction algorithms / 40-nm process technology / flat extraction technology / system-on-chip / isomorphic hierarchical back-annotation technology / process technologies / SRAM / Simulation / hierarchical extraction technology / process technology / integrated circuits / Nanometer technology / /

URL

www.synopsys.com / http /

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