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Roughness
Results: 365

#	Item
31	Manufacturing Rev. 2016, 3, 4 S.F. Jahn et al., Published by EDP Sciences, 2016 DOI: mfreviewAvailable online at: http://mfr.edp-open.org Add to Reading List Source URL: mfr.edp-open.org Language: English Tribology Manufacturing Chemistry Materials science Friction Lubrication Lubricant Abrasive Grinding Surface roughness Surface finish
32	Formtracer SV-C3200 / SV-C4500 SERIES 525 — Surface Roughness / Contour Measuring System SV-C3200S4 with personal computer system and software Add to Reading List Source URL: www.mitutoyo.com Language: English Metrology Engineering Mechanical engineering Materials science Waviness Measuring instrument Gear Academia
33	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Electric Field and Strain Effects on Surface Roughness Induced Spin Relaxation in Silicon Field-Effect Transistors Dmitri Osintsev, Oskar Baumgartner, Zlatan Stanojevic, Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English - Date: 2013-02-12 08:39:11
34	Grazing incidence broad ion beams for reducing line-edge roughness Add to Reading List Source URL: cpmi.illinois.edu Language: English - Date: 2015-04-22 08:46:32
35	PDF Document Add to Reading List Source URL: www.mitutoyo.com Language: English Mechanical engineering Metalworking terminology Surface roughness Tribology Waviness Engineering
36	Appendix D – Roughness Measurements for Nerrigundah Catchment Page D-1 APPENDIX D D.ROUGHNESS MEASUREMENTS FOR Add to Reading List Source URL: users.monash.edu.au Language: English - Date: 2000-08-24 09:02:08
37	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Multi-scale Simulation of Interfacial Roughness Effects in Silicon Nanowires Byung-Hyun Kim1,2, Hyo-Eun Jung3, Yong-Chae Chung2, Mincheol Shin3, Kwang-Ryeol Lee,1 1 Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English* - Date: 2013-02-12 08:39:04
38	SISPAD 2012, September 5-7, 2012, Denver, CO, USA Impact of Line-Edge Roughness on Electrical Resistivity in Decananoscale Copper Wires: A Monte Carlo Study Takashi Kurusu, Hiroyoshi Tanimoto, Makoto Wada, Atsunobu Isob Add to Reading List Source URL: in4.iue.tuwien.ac.at Language: English - Date: 2013-02-12 08:39:12
39	Letter pubs.acs.org/NanoLett Quantifying Surface Roughness Eﬀects on Phonon Transport in Silicon Nanowires Jongwoo Lim,†,∥,# Kedar Hippalgaonkar,§,∥,# Sean C. Andrews,†,‡,∥ Arun Majumdar,§,∥,⊥ Add to Reading List Source URL: nanowires.berkeley.edu Language: English - Date: 2013-02-28 12:10:08
40	Easy to evaluate network level road conditions! BumpRecorder is only using smartphone to evaluate road roughness, but NOT require special equipment. You just drive a passenger car with smartphone, BumpRecorder will recor Add to Reading List Source URL: www.bumprecorder.com Language: English - Date: 2015-07-01 03:26:00

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