Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

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Date: 2016-08-22 14:30:22		Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility Add to Reading List Source URL: www.apec-conf.org Download Document from Source Website File Size: 209,03 KB Share Document on Facebook