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Sputtering / Chemistry / Thin film / Manufacturing / Semiconductor device fabrication / Thin film deposition / Optical coating / Materials science / Thin films / Coatings


Surface and Interface 16A1/2002S2003 Analysis of X-ray reflectivity from sputtered carbon thin films (1) Consideration of density gradient
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Document Date: 2010-01-05 10:30:38


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File Size: 75,98 KB

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