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Spectroscopy / Crystallography / Anions / Silicide / X-ray / Reflection high-energy electron diffraction / Yield / Physics / Mechanics / Solid mechanics


Surface and Interface 9C, 14B, 15C/2001G065 Preparation of a-Si/Fe/Si(111) interface and its characterization Shinichiro NAKATANI*1, Toshio TAKAHASHI1 and Keiichi HIRANO 2
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Document Date: 2010-01-05 10:30:39


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File Size: 56,96 KB

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Country

Japan / /

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Facility

Institute of Materials Structure Science / The University of Tokyo Kashiwanoha / /

MusicGroup

X-ray / /

Organization

Institute of Materials Structure Science / University of Tokyo Kashiwanoha / Institute for Solid State Physics / /

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Technology

radiation / X-ray / /

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