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Computer hardware / MOSFET / Flash memory / High-k dielectric / Dynamic random-access memory / CMOS / Soft error / Reliability engineering / Threshold voltage / Computer memory / Electronics / Electronic engineering
Date: 2014-03-30 20:29:47
Computer hardware
MOSFET
Flash memory
High-k dielectric
Dynamic random-access memory
CMOS
Soft error
Reliability engineering
Threshold voltage
Computer memory
Electronics
Electronic engineering

1 Table PIDS1 Near-Term[removed]

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