NOAA's / Oak Ridge National Laboratory / ATDD / Sensor Metrics Inc. / Lockheed Martin Energy Research Corp. / NOAA's Atmospheric Turbulence / /
Currency
USD / /
Event
Business Partnership / /
Facility
Micromachining Center of North Carolina / Plant Oak Ridge / University of Tennessee-Knoxville / /
IndustryTerm
chemical measurements / government applications / microtelesensor chips / Spread-spectrum systems / software algorithms / signal-processing methods / monolithic devices / microtelesensor chip / microsensor technology / radio control equipment / communication systems / energy sources / microelectromechanical systems / instantaneous upgrades to existing systems / intelligent wireless networking / lightweight technology / spectral management / Wireless Networks / wireless data transmission / produced hardware / high-accuracy wireless sensors / high-energy thin-film batteries / fabrication technology / communications systems / chemical vapors / larger network / deployable devices / electronics / fabricated device / electronic processing / waste management / technology exploiting commercial microsensors / semiconductor fabrication technology / satellite-linked data collection systems / wireless links / onchip signal processing / power-management hardware / chemical and physical measurements / metal films / signal-processing electronics / wireless linking / chemicals / short-range communications paths / /
Organization
U.S. Department of Energy / Atmospheric Turbulence and Diffusion Lab / Micromachining Center of North Carolina / National Oceanic and Atmospheric Administration / NOAA's Atmospheric Turbulence and Diffusion Division / University of Tennessee / Navy / ASIC / National Aeronautics and Space Administration / /
Person
C. L. Britton / Jr. / D. L. Auble Atmospheric Turbulence / R. P. Hosker / Jr. / L. N. Howell / Jr. / /
Session Papers A New Microtelesensor Chip for Meteorology W. W. Manges, R. J. Warmack, C. L. Britton, Jr., W. L. Bryan, M. L. Simpson, S. F. Smith, K. J. Scott, K. B. Jacobson, T. G. Thundat, A. L. Wintenberg and P. I.