Failure rate (MTBF) Device: Automotive products (for R8 Series and for H type, J type and K type) The failure rate is reported as follows. This is based on JIS-C5003. 1. Condition 1-1. High temperature bias test result T - R8 - Document - PDFSEARCH.IO

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	Failure rate (MTBF) Device: Automotive products (for R8 Series and for H type, J type and K type) The failure rate is reported as follows. This is based on JIS-C5003. 1. Condition 1-1. High temperature bias test result T Add to Reading List Document Date: 2015-03-29 21:59:08 Open Document File Size: 53,33 KB Share Result on Facebook

Failure rate (MTBF) Device: Automotive products (for R8 Series and for H type, J type and K type) The failure rate is reported as follows. This is based on JIS-C5003. 1. Condition 1-1. High temperature bias test result TAdd to Reading List