Device Reliability Report Third Quarter 2013

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Date: 2013-11-19 19:55:52 Integrated circuits Digital electronics Electronic design Logic gates Field-programmable gate array Xilinx CMOS Reliability engineering Nonvolatile BIOS memory Electronic engineering Electronics Design		Device Reliability Report Third Quarter 2013 Add to Reading List Source URL: www.xilinx.com Download Document from Source Website File Size: 2,27 MB Share Document on Facebook

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