<--- Back to Details
First PageDocument Content
Design for X / Design for testing / Electronic design automation / Post-silicon validation / Debugging / System on a chip / Integrated circuit / Application-specific integrated circuit / Electronic engineering / Design / Electronics
Date: 2009-03-25 10:36:42
Design for X
Design for testing
Electronic design automation
Post-silicon validation
Debugging
System on a chip
Integrated circuit
Application-specific integrated circuit
Electronic engineering
Design
Electronics

T503-medea[removed]:46

Add to Reading List

Source URL: www.catrene.org

Download Document from Source Website

File Size: 86,54 KB

Share Document on Facebook

Similar Documents

Wireless networking / Wireless sensor network / Sensor / cole Polytechnique Fdrale de Lausanne / Technology / Education in Switzerland / Higher education

Call For Papers The International Workshop on Advances in Sensors and Interfaces is a premier Sensor and Interface design workshop aimed at bridging the gap between electronic design and integrated circuit technologies,

DocID: 1xV2r - View Document

KC5041 FM STEREO The Mini-mitter is a miniature stereo FM transmitter using just one integrated circuit and

DocID: 1vnw0 - View Document

DATA SHEET BIPOLAR ANALOG INTEGRATED CIRCUIT µPC8172TB

DocID: 1v0ZR - View Document

LM35/LM35A/LM35C/LM35CA/LM35D Precision Centigrade Temperature Sensors General Description The LM35 series are precision integrated-circuit temperature sensors, whose output voltage is linearly proportional to the Celsiu

DocID: 1uE7a - View Document

NTE843 Integrated Circuit TV Video IF Phase Locked Loop (PLL) Synchronous Detector Description: The NTE843 is a linear IC synchronous detector employing a phase–locked oscillator to demodulate

DocID: 1uyZB - View Document