<--- Back to Details
First PageDocument Content
Force / Packaging materials / Plastics / Dielectrics / Electricity / BoPET / Dielectric absorption / Polypropylene / Ceramic capacitor / Electromagnetism / Physics / Capacitors
Date: 2009-03-12 18:57:10
Force
Packaging materials
Plastics
Dielectrics
Electricity
BoPET
Dielectric absorption
Polypropylene
Ceramic capacitor
Electromagnetism
Physics
Capacitors

AMERICAN CAPACITOR CORPORATION TECHNICAL INFORMATION BROCHURE

Add to Reading List

Source URL: www.americancapacitor.com

Download Document from Source Website

File Size: 811,29 KB

Share Document on Facebook

Similar Documents

OWNERʼS MANUAL FOR WIRE MANAGEMENT TOOLS: Cable Trestles, Wall Trestles, Triads, Cable Spreaders and Low Dielectric Absorption Tape 1. CONCEPT AND DESIGN The first instinct of any audiophile who wants a nice-looking sys

DocID: 1k10h - View Document

Condensed matter physics / Environmental chemistry / Materials science / Atomic physics / High-k dielectric / Transistors / Photoemission spectroscopy / Core electron / X-ray absorption spectroscopy / Physics / Chemistry / Science

PDF Document

DocID: 1954S - View Document

Energy / Electricity / Physical quantities / Energy storage / Capacitance / Dielectric / Types of capacitor / Dielectric absorption / Electromagnetism / Capacitors / Physics

HW8 Concepts Alex Alemi October 21, 2009 1

DocID: 18Owq - View Document

Spectroscopy / Emission spectroscopy / Annealing / Silicide / Polycrystalline silicon / Photoemission spectroscopy / High-k dielectric / Absorption spectroscopy / Core electron / Chemistry / Physics / Science

Photon Factory Activity Report 2006 #24 Part BSurface and Interface 2C/2005S2-002 Suppression of silicidation and crystallization by atmosphere controlled annealing

DocID: 1870T - View Document

Physics / Environmental chemistry / Materials science / Spectroscopy / X-ray absorption spectroscopy / High-k dielectric / XANES / Science / Chemistry / Condensed matter physics

Photon Factory Activity Report 2004 #22 Part BSurface and Interface 2C/2002S2-002 Crystallization in HfO2 gate insulators with in situ annealing

DocID: 17N98 - View Document