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Texture measurements on thin films using an X-ray microfocus source Bernd Hasse, Jörg Wiesmann, Carsten Michaelsen Incoatec GmbH, Max-Planck-Str. 2, 21502 Geesthacht, Germany Introduction
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Document Date: 2014-03-18 12:19:06
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Texture measurements on thin films using an X-ray microfocus source Bernd Hasse, Jörg Wiesmann, Carsten Michaelsen Incoatec GmbH, Max-Planck-Str. 2, 21502 Geesthacht, Germany Introduction