PRISM Seminar Series – Spring 2009 Pursuing High Reliability in Microelectronics: Analysis, Environmental Testing, and Reliability Prediction Andre Kleyner, Ph.D., M.E. Product Validation Architec - Physics of failure - Document - PDFSEARCH.IO

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Technology Engineering Design for X Materials science Reliability engineering Reliability Physics of failure American Society for Quality Systems engineering Engineering statistics Survival analysis		PRISM Seminar Series – Spring 2009 Pursuing High Reliability in Microelectronics: Analysis, Environmental Testing, and Reliability Prediction Andre Kleyner, Ph.D., M.E. Product Validation Architec Add to Reading List Source URL: www.purdue.edu Download Document from Source Website File Size: 229,01 KB Share Document on Facebook

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