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Electronic engineering / High-k dielectric / Threshold voltage / Short-channel effect / Meindl / Symmetric matrix / Electrical engineering / Electromagnetism / MOSFET


Compact, Physics-based Modeling of Nanoscale Limits of Double-Gate MOSFETs Qiang Chen, Lihui Wang, Raghunath Murali and James D. Meindl March 10, 2004
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Document Date: 2010-03-19 15:37:51


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File Size: 1,74 MB

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