1 Mining IC Test Data to Optimize VLSI Testing

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Date: 2000-04-26 13:22:07 Electronics Wafer Integrated circuit Package testing Wafer testing Nasiri-Fabrication Semiconductor device fabrication Technology Microtechnology		1 Mining IC Test Data to Optimize VLSI Testing Add to Reading List Source URL: web.engr.oregonstate.edu Download Document from Source Website File Size: 153,44 KB Share Document on Facebook

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