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216 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 53, NO. 1, FEBRUARY 2004 A Sensitive Optical Polarimetric Imaging Technique for Surface Defects Detection
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Document Date: 2010-02-04 13:04:24
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216 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 53, NO. 1, FEBRUARY 2004 A Sensitive Optical Polarimetric Imaging Technique for Surface Defects Detection