Back to Results
First PageMeta Content



OCVD 法によるダイヤモンド p-i-n ダイオードのキャリア寿命測定 Carrier lifetime in diamond p-i-n diode by Open Circuit Voltage Decay method (OCVD) ○ A. Traore1, A. Nakajima1, T. Makino1, D. Kuwaba
Add to Reading List

Document Date: 2017-11-01 22:26:41


Open Document

File Size: 145,49 KB

Share Result on Facebook