ISSN No: International Journal - Open NAND Flash Interface Working Group - Document - PDFSEARCH.IO

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Date: 2014-12-31 05:05:11 Digital electronics Electronic design Computer memory Logic gates Integrated circuits Flip-flop Phase-locked loop Phase detector Glitch Open NAND Flash Interface Working Group CMOS Jitter		ISSN No: International Journal & Magazine of Engineering, Technology, Management and Research A Monthly Peer Reviewed Open Access International e-Journal Add to Reading List Source URL: www.ijmetmr.com Download Document from Source Website File Size: 946,50 KB Share Document on Facebook

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